May 2026 KLA Corporation expanded its semiconductor inspection and metrology portfolio by launching advanced process control solutions designed for next-generation semiconductor manufacturing and advanced packaging applications.
March 2026 Applied Materials introduced new wafer inspection and metrology technologies featuring AI-powered defect detection and improved measurement accuracy for advanced semiconductor nodes.
December 2025 ASML expanded its semiconductor measurement and inspection capabilities by enhancing its computational lithography and process control solutions to support advanced chip production.
September 2025 Hitachi High-Tech launched upgraded semiconductor metrology systems with improved precision and automation capabilities for high-volume semiconductor manufacturing processes.